专利内容由知识产权出版社提供
专利名称：OPTICAL MEASURING SYSTEM发明人：Katsushige Nakamura,Minoru
Nakamura,Katsuhiro Miura,Masao Doi
申请号：US12067751申请日：20060921
公开号：US20090213362A1公开日：20090827
专利附图：
摘要：An optical measuring system has a first optical measuring instrument and asecond optical measuring instrument. The optical measuring system includes a firstoptical path to guide a first beam from a measuring region to the first optical measuring
instrument, a second optical path to guide a second beam from the measuring region tothe second optical measuring instrument, an optical system through which the first andsecond optical paths extend and in which the first and second optical paths are paraxial, areflection area to change the direction of the first optical path, the second optical pathcrossing the reflection area, and a light transmission area arranged at a position wherethe reflection area and second optical path cross each other, the light transmission areahaving a higher light transmittance than the reflection area.
申请人：Katsushige Nakamura,Minoru Nakamura,Katsuhiro Miura,Masao Doi
地址：Tokyo JP,Kyoto JP,Tokyo JP,Tokyo JP
国籍：JP,JP,JP,JP
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