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专利名称：Semiconductor device including fuse and
method for testing the same capable ofsuppressing erroneous determination
发明人：Kiyoshi Kanno申请号：US11514235申请日：20060901公开号：US07474106B2公开日：20090106
专利附图：
摘要：In a semiconductor device including first and second power supply terminals, ameasuring terminal, and at least one trimming detection circuit connected between the
measuring terminal and one of the first and second power supply terminals, the trimmingdetection circuit is constructed by a current supplying element, a series arrangement of afuse and a switch element, and a determination circuit. The current supplying elementand the series arrangement are connected in series between the measuring terminal andthe one of the first and second power supply terminals. The determination circuit has aninput connected to a node between the current supplying element and the series
arrangement and is adapted to determine whether the fuse is in a connection state or in adisconnection state. A voltage at the other of the first and second power supplyterminals is applied to the measuring terminal in a normal mode.
申请人：Kiyoshi Kanno
地址：Kanagawa JP
国籍：JP
代理机构：Sughrue Mion, PLLC
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