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专利名称：System and method for multiple image
analysis
发明人：Tan Seow Hoon,Sreenivas Rao申请号：US09876795申请日：20010607
公开号：US20020186878A1公开日：20021212
专利附图：
摘要：A system for analyzing multiple images is provided, such as to locate defects ina test component. The system includes a first light source, such as one that emits bluelight, and a second light source, such as one that emits red light. The system also includes
a camera, where the camera and the light sources are focused on an area where a testpiece is to be placed. A multiple image processor is connected to the first light source,the second light source, and the camera. The multiple image processor causes the firstlight source and the second light source to turn on, such as in sequence, and also causesthe camera to generate two or more sets of image data, such as one set when each ofthe light sources is illuminated, through the use of filters or tuned pixels, or otherwise.
申请人：HOON TAN SEOW,RAO SREENIVAS
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